Uncategorized Photo-optical luminance analysis of transfer films: Measurement principle, data analysis and result plotting By aardco on Friday, September 18, 2020 Publication date: January 2021Source: Tribology International, Volume 153Author(s): Andreas Gebhard, Bai Cheng Jim https://www.sciencedirect.com/science/article/pii/S0301679X20304540?dgcid=rss_sd_all Previous Post Next Post Related Posts Uncategorized Analysis of chip size distribution using image processing technology to estimate wear state of cylindrical grinding wheel Uncategorized Temperature-dependent tribological behavior of MoSx thin films synthesized by HiPIMS Uncategorized Comparison of machining performance under MQL and ultra-high voltage EMQL conditions based on tribological properties
Uncategorized Analysis of chip size distribution using image processing technology to estimate wear state of cylindrical grinding wheel
Uncategorized Comparison of machining performance under MQL and ultra-high voltage EMQL conditions based on tribological properties